Product technical indicators

Hi-Smarc-Ⅲ-PO laser interferometer

Main function: Measure the surface profile of planar optical elements and the integrated wavefront of transmission optical elements

a) Type: Fizeau Interference Principle

b) Caliber: φ25.4mm

c) Display mode: CCD+display

d) Light source: semiconductor laser, wavelength λ=635nm

e) Measurement repeatability: PV is better than λ/50, RMS is better than λ/100

f) Plane accuracy: PV (the maximum difference value from the highest point to the lowest point on the plane, also known as the peak-valley value) is better than λ/20 (635nm/20 is about 32nm),

g) Host weight: 6.5KG

h) Dimensions: 260×160×330mm

i) Power supply: 220V 50HZ

j) Quantitative test time: about 2～3 seconds/time

Analysis system (software and computer)

1. Computer: dedicated computer and LCD monitor above 10 inches

   2. Output data:

Peak-valley value (PV), standard deviation (RMS), two-dimensional contour map (contour map), interference fringe map;

Threshold setting (OK or NG), data can be saved, and test report can be output and printed;

Open data output format to facilitate subsequent analysis;

3. Measurement function

The system runs under WINDOWS 7 or 10, allowing network data transmission;

Software adjustment mechanism for the brightness of the interferogram;

4. Provide phase shifter correction software, users can correct the displacement error of the phase shifter by themselves.

5. Provide software upgrades, maintenance, after-sales technical support and use training, hardware repairs;