1. Product naming rules:
The SS-60 series of products is a low-profile scanning electron microscope for most factories and laboratories with lower requirements. The series of products include the following configurations:
The model naming rules are as follows:
Second, a brief description: (Description)
(1) The maximum magnification is 60,000 times (Magnification Max 60,000x)
(2) Adopt secondary electron and backscattered electron dual detector (Signal Detection: SE Detector+BSE Detector)
(3) 5KV~30KV acceleration voltage selection, high image resolution (Accelerating Voltage: 5kV to 30Kv, High image resolution)
(4) EDS is optional for component analysis (EDS is optional, for component analysis)
(5) Installation a cooling Stage, Can measure aqueous samples without pretreatment (Installation a cooling Stage, Can measure aqueous samples without pretreatment)
(6) The high/low vacuum configuration shortens the pre-processing process (High&Low Vacuum System)
(7) The CCD camera is mounted to view the inside of the stage
(8) Tilt (0~45) stage configuration (optional) (Tilt Stage configuration (optional))
3. Technical parameters: (Product specifications)
（Resolution）
| 15nm (30kV, SE Image) |
20nm (30kV, BSE Image) | |
（Magnification） | 30x~60,000x |
（Accelerating Voltage） | 5kV to 30kV (5Kv/10Kv/15kV/20kV/30Kv-5 step) |
Observation mode | Standard Mode |
Charge-up reduction mode | |
（Electron Gun） | |
（Filament type） | （Pre Centered tungsten filament Cartridge） |
偏压系统（Bias voltage system） | （Automatic mode） |
（Electron gun alignment） | （Manual mode） |
（Lens system） | |
（Focus Lens） | (2-stage Electromagnetic Condenser Lens) |
（Objective Lens） | (1-stage Electromagnetic Objective Lens) |
(Detector type) | SE Detector/ BSE Detector |
( Stage System) | Auto or Mauanl |
（Stage Traverse） | 3 axis System， X, Y-axis : 35mm / R-axis : 360° |
Image shift | Image shift X, Y Image Shift (±150um) |
（Max Sample size） | 30mm70mm，70mm in diameter, 30mm in height |
（Image Scanning system） | (Fast Scan): 320x240 (Scan time: 0.1 sec.) |
(Slow Scan): 640x480 (Scan time: 3 sec.) | |
1(Photo Mode 1): 1280x960 (Scan time: 30sec.) | |
2(Photo Mode 2): 2560x1920 (Scan time: 60sec.) 3(Photo Mode 2): 5120x3840 (Scan time: 120sec.) | |
（Automatic Function） | (Auto start)，(Auto focus)，(Auto Brightness/Contrast) |
(Image format) | BMP, JPEG, PNG,TIFF |
(Data display) | (Magnification)，(Detector type)，(Accelerating Voltage)，(Vacuum mode)，Logo(Text)， Date and time，Text marker，(scale bar) |
（Vacuum system） | (Fully Automatic Multi mode) Rotary Pump/100Liters/min Turbo Molecular Pump/ 70Liters/sec (pump down time)： (less than 2 minutes) |
(Control unit system) | (Mouse ,Keyboard) |
CPU : Intel CoreTM i5 or High version Memory / HDD : 4GB / 500GB or High version USB 2.0 | |
（Software function） | (Image file open, edit, Save function) (Length, area, angle measuring) |
（ Volume） | （Main Unit）-410(W)×660(D)× 600(H)mm……1set Anti vabration Table |
（Weight） | 105kg |
（Equipment environment） | (Temperature)：15℃~30℃ (Power source)： Single phase 100~240V AC, 1KW, 50/60Hz |
4. Sample test results
We used a defective screw discarded in the laboratory as a sample for actual testing. The picture is as follows:
Screw, magnification 47 times, 30 kV, SE detector, high vacuum mode 
Screw cap part, magnification 100 times, 10 kV, SE detector, high vacuum mode
Screw, magnification 47 times, 30 kV, SE detector, high vacuum mode 
Screw cap part, magnification 100 times, 10 kV, SE detector, high vacuum mode 
Thread part, magnification 100 times, 10 kV, SE detector, high vacuum mode 
Thread bottom part, magnification 500 times, 10 kV, SE detector, high vacuum mode
（Accessories package）：
Pre Centered tungsten filament | 5 pcs/box |
（Sample Stage）
| 15mm dia. (10 pcs) |
25mm dia. (10 pcs) | |
15mm 45° Tilt (5 pcs) | |
15mm 90° Tilt (5pcs) | |
(Vacuum pump oil) | 1ea |
(Height standard master) | 1ea |
(allen wrench) | 1set |
(SEM Software CD) | 1ea |
(Silver Paste) 30g | 1ea |
(Carbon conductive tape) | 1roll |
(scissors) | 1ea |
(aurilave) | 1ea |
(tweezers) | 1ea |
(Tools Box) | 1ea |
